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- ANALYSERS - ANALYTICAL
- ANALYTICAL LABORATORY EQUIPMENT/INSTRUMENT
- ATOMIC FORCE MICROSCOPE (AFM)
- DETECTORS (ALL KINDS)
- ELECTRON BACK SCATTER DIFFRACTION (EBSD)
- ENERGY DISPERSIVE XRAY FLUORESCENSE SPECTROMETER
- MATERIAL TESTING LAB EQUIPMENT
- METROLOGY
- MICROSCOPY PRODUCTS, SOFTWARE & SOLUTION/ACCESORIES
- QUALITY CONTROL
- SCIENTIFIC INSTRUMENTS
- SILICON DRIFT DETECTOR (SDD)
- SPECIALIST ANALYTICAL EQUIPMENT
- SPECTROMETERS (ALL KINDS)
- SPECTROMETRY SOLUTIONS (ALL KINDS)
- TRIBOMETERS
- WAVELENGTH DISPERSIVE SPECTROMETERS/WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETERS
- X-RAY FLOURESCENCE ANALYSERS
- X-RAY SPECTROMETERS
- XRF APPLICATIONS, SYSTEMS & ACCESSORIES
Bruker Nano GmbH - Stand 524
Am Studio 2D, 12489 Berlin
Germany
+49 30 670990-30
Bruker Nano offers solutions for all your nanoscience needs.
Bruker Nano Analytic’s electron microscope analyzers QUANTAX EDS, QUANTAX WDS, QUANTAX EBSD and QUANTAX Micro-XRF on SEM provide unmatched comprehensive compositional and structural materials analysis. The M-series for micro X-ray fluorescence spectrometry (Micro-XRF) as well as the handheld X-ray fluorescence (XRF) analyzers TITAN and TRACER and the CTX Counter Top XRF enable non-destructive element analysis. Our total reflection X-ray fluorescence (TXRF) spectrometers add to our range of nano analysis solutions.
Bruker Nano Surfaces offers 3D metrology and inspection systems including atomic force microscopes, optical/stylus profilers and mechanical and tribological tools with unmatched capabilities.