Bruker Nano offers solutions for all your nanoscience needs.
Bruker Nano Analytic’s electron microscope analyzers QUANTAX EDS, QUANTAX WDS, QUANTAX EBSD and QUANTAX Micro-XRF on SEM provide unmatched comprehensive compositional and structural materials analysis. The M-series for micro X-ray fluorescence spectrometry (Micro-XRF) as well as the handheld X-ray fluorescence (XRF) analyzers TITAN and TRACER and the CTX Counter Top XRF enable non-destructive element analysis. Our total reflection X-ray fluorescence (TXRF) spectrometers add to our range of nano analysis solutions.
Bruker Nano Surfaces offers 3D metrology and inspection systems including atomic force microscopes, optical/stylus profilers and mechanical and tribological tools with unmatched capabilities.