Bruker Nano offers solutions for all your nanoscience needs.
Bruker Nano Analytic’s electron microscope analyzers QUANTAX EDS, QUANTAX WDS, QUANTAX EBSD and QUANTAX Micro-XRF on SEM provide unmatched comprehensive compositional and structural materials analysis. The M series for micro X ray fluorescence spectrometry (Micro-XRF) as well as the handheld X-ray fluorescence (XRF) analyzers TITAN and TRACER enable non-destructive element analysis. Our total reflection X ray fluorescence (TXRF) spectrometers add to our range of nano analysis solutions.
Bruker Nano Surfaces offers 3D metrology and inspection systems including atomic force microscopes, optical/stylus profilers and mechanical and tribological tools with unmatched capabilities.